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Thursday, July 16, 2020 | History

4 edition of Reliability problems of semiconductor lasers found in the catalog.

Reliability problems of semiconductor lasers

P. G. Eliseev

Reliability problems of semiconductor lasers

by P. G. Eliseev

  • 274 Want to read
  • 24 Currently reading

Published by Nova Science Publishers in New York .
Written in English

    Subjects:
  • Semiconductor lasers -- Reliability -- Congresses.

  • Edition Notes

    Includes bibliographical references (p. 275-301) and index.

    StatementP.G. Eliseev ; translated by Kevin S. Hendzel.
    SeriesProceedings of the Lebedev Physics Institute / Academy of Sciences of the USSR,, v. 197, Trudy Fizicheskogo instituta., v. 197
    Classifications
    LC ClassificationsQC1 .A4114 vol. 197, TA1700 .A4114 vol. 197
    The Physical Object
    Paginationviii, 305 p. :
    Number of Pages305
    ID Numbers
    Open LibraryOL1561020M
    ISBN 100941743942
    LC Control Number91042314
    OCLC/WorldCa24871683

    This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and - Selection from Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices [Book] COVID Resources. Reliable information about the coronavirus (COVID) is available from the World Health Organization (current situation, international travel).Numerous and frequently-updated resource results are available from this ’s WebJunction has pulled together information and resources to assist library staff as they consider how to handle coronavirus

    In fact, with continued advances in the reliability of diodes used in DPSS (diode-pumped solid-state) lasers, these lasers can provide many years of uninterrupted operation. Laser geometry There are a few basic methods for introducing diode laser pump light into a Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices - Ebook written by Peter W. Epperlein. Read this book using Google Play Books app on your PC, android, iOS devices. Download for offline reading, highlight, bookmark or take notes while you read Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical

    Get this book in print. Access Online via Elsevier; -n junction photodiode Phys planar power drift pulse quantum efficiency Quantum Electron quaternary recombination refractive index reliability semiconductor lasers shown in Fig single-mode spectral spontaneous emission stripe width structure substrate Temkin temperature This comparative tutorial describes the reasons behind device failures and provides practical information on what can be done to minimize failure-prone designs and enhance device reliability. The text demonstrates how, with such advantages as smaller size, low-cost and simple operation, LEDs are well suited for a wide range of applications - especially in the field of optical fibre ://


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Reliability problems of semiconductor lasers by P. G. Eliseev Download PDF EPUB FB2

The reliability of semiconductor sources is very dependent on the degradation Lasers, unlike LED’s will not operate below a threshold current. Meaning, only when the threshold current is reached will the diode commense lasing (functioning).

As mentioned previously, LEDs and laser diodes are problems with soft solders. Buried Reliability problems of semiconductor lasers. [P G Eliseev] Home.

WorldCat Home About WorldCat Help. Search. Search for Library Items Search for Lists Search for Contacts Book: All Authors / Contributors: P G Eliseev. Find more information about: ISBN: OCLC This reference book provides a fully integrated novel Reliability problems of semiconductor lasers book to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book ://   This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature.

Diode laser fundamentals are discussed, followed by an The book “Semiconductor Laser Engineering, Reliability and Diagnostics” by Dr. P.W. Epperlein is a landmark in the recent literature on semiconductor lasers because it fills a longstanding gap between many excellent books on laser theory and the complex and challenging endeavor to fabricate these devices reproducibly and reliably in an  › Home › Subjects › Physics & Astronomy › Optics & Photonics.

a Reliability and degradation of semiconductor lasers and LEDs / c Mitsuo Fukuda. a Boston: b Artech House, c a X, p.: b ill ; c 24 cm.

a Includes bibliographical references and index. 7: a Semiconductor lasers x Reliability. 2 lcsh: 7: a Light emitting diodes x Reliability.

2 lcsh: 4: x EA b TW05 c T57   Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices - Kindle edition by Epperlein, Peter W. Download it once and read it on your Kindle device, PC, phones or tablets. Use features like bookmarks, note taking and highlighting while reading Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to  › Kindle Store › Kindle eBooks › Engineering & Transportation.

Reliability and Degradation of Semiconductor Lasers and LEDs book. Read reviews from world’s largest community for readers. This comparative tutorial des Buy Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices by Peter W.

Epperlein (ISBN: ) from Amazon's Book Store. Everyday low prices and free delivery on eligible ://   Keywords: nm, high-power diode lasers, reliability, accelerated lifetime tests 1.

INTRODUCTION The broad industrial application of high-power laser diodes (HPLDs) started more than 10 years ago. HPLDs are used directly in materials processing, medicine, display, or priniting systems, but also as pump sources for various rod, disk, The book &;Semiconductor Laser Engineering, Reliability and Diagnostics&; by Dr.

P.W. Epperlein is a landmark in the recent literature on semiconductor lasers because it fills a longstanding gap between many excellent books on laser theory and the complex and challenging endeavor to fabricate these devices reproducibly and reliably in an Semiconductor lasers can be made single-frequency lasers by introducing additional wavelength-selective elements into the laser cavity that select only one of the longitudinal modes.

This is commonly accomplished with Bragg gratings monolithically integrated into the laser structure. As shown in Figure 6, the gratings may either replace the laser mirrors and are therefore put at one or both Materials and Reliability Handbook for Semiconductor Optical and Electron Devices provides comprehensive coverage of reliability procedures and approaches for electron and photonic devices.

These include lasers and high speed electronics used in cell phones, satellites, data transmission systems and :// Find helpful customer reviews and review ratings for Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices by Peter W.

Epperlein () at Read honest and unbiased product reviews from our :// The chapters of this book follow the format and order of the sessions of the meeting. Thirty-six papers were presented and discussed during the five-day Workshop. In addi­ tion, two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were A Practical Approach to High Power and Single Mode Devices.

This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book :// This book introduces high power semiconductor laser packaging design.

The challenges of the design and various packaging and testing techniques are detailed by the authors. New technologies and current applications are described in  › Energy › Systems, Storage and Harvesting.

This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of :// The book "Semiconductor Laser Engineering, Reliability and Diagnostics" by Dr.

P.W. Epperlein is a landmark in the recent literature on semiconductor lasers because it fills a longstanding gap between many excellent books on laser theory and the complex and challenging endeavor to fabricate these devices reproducibly and reliably in an   Long wavelength lasers have now reached the developmental stage and are being used in high speed optical fiber communications throughout the world.

Research at AT and T Bell Labs has resulted in major developments in the area of semiconductor lasers. This book is. Questions regarding the reliability and degradation of active III-V semiconductor devices are explored, giving attention to a small signal GaAs FET reliability assessment, power GaAs FET reliability, catastrophic failures, adverse ambient effects, the reliability of other GaAs devices, and materials related problems.

The reliability and bookT.H/abstract. The book starts with talking generally about optical communications and the need for semiconductor lasers. It then discusses the general physics of lasers, and moves on to the relevant specifics of semiconductors.

There are chapters on optical cavities, direct modulation, distributed feedback, and electrical properties of semiconductor The reliability problems were related to either photo-induced chemical reactions on the output facet leading to visible optical damage or the propensity of the material to rapidly develop dark line defects.

To improve the reliability of high power laser diodes, we have performed numerous aging studies, followed by detailed failure mode ://